Renishaw probes

Measurement system that comes into contact with the component, causing a displacement of the probe mechanism. The generated signal allows the acquisition of the measurement. The type and size of the stylus is chosen according to the inspected item.

Usage details

  • Surface finish measurement and dimensional inspection;
  • reduction of cycle times from 15% to 50%;
  • maximising production with minimum capital investment;
  • maximum stylus stiffness and high tip sphericity.
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